Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
Institute of Radiophysics and Electronics of NAS RA
Results of studies of dark current-voltage and capacitance-voltage characteristics of near-infrared sensitive (p)InSb/(n)CdTe heterostructure are presented. It is shown that the junction fabricated by the pulsed laser deposition (PLD) technology has a low number of states at the interface, which leads to the electrical properties explained by physical characteristics of heterostructure pairs.
oai:arar.sci.am:23422
ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան
Dec 13, 2023
Feb 27, 2020
25
https://arar.sci.am/publication/26175
Հրատարակութեան անունը | Թուական |
---|---|
THE DARK CURRENT-VOLTAGE AND CAPACITANCE-VOLTAGE CHARACTERISTICS OF NEAR-INFRARED SENSITIVE (p)InSb/(n)CdTe HETEROSTRUCTURE | Dec 13, 2023 |
Sarian, V. K. Mkrtchyan, A. H. Meshcheryakov, R. V.
V. V. Baghramyan Sargsyan, A. A. A. S. Sargsyan N. B. Knyayan V. V. Harutyunyan E. M. Aleksanyan N. E. Grigoryan A. H. Badalyan
S. K. Nikoghosyan A. G. Sargsyan E. G. Zargaryan E. A. Mughnetsyan
N. Yeranyan
N. S. Yeranyan
A. Zolanvar H. Sadeghi A. Ranjgar
M. Ghannad Dezfouli Trouni, K. G. V. R. Kocharyan