Publication Details:

Established in 2008

Journal or Publication Title:

Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես

Date of publication:

2016

Volume:

9

Number:

1

ISSN:

1829-1171

Official URL:

Corporate Creators:

Department of Physics, Faculty of Science, Arak University, Arak, 38156-8-8349, Iran

Coverage:

15-19

Abstract:

In this study pure Ag particles were deposited on the glass substrate using DC magnetron sputtering at room temperature and Ag thin film with 80nm thickness was prepared. To investigation the effect of high temperature on the crystal structure of Ag thin film, an in-situ HT-XRD instrument has been used. Microstructural properties of Ag thin film have been studied in several temperatures. Micrograin size of different atomic planes of Ag thin film during HT-XRD process was calculated. Residual stress of as-deposited and post annealed Ag thin film at (111) planes was measured using Sin2ψ method.

Date created:

2016-03-19

Format:

pdf

Identifier:

oai:arar.sci.am:23418

Location of original object:

ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան