Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
The statistical non-triviality of current carrier mobility fluctuations in non-degenerate semiconductors is studied in the frames of the newly developed variance approach theory. Expressions for electron mobility variances conditioned by the fluctuations of conduction band energy level occupancy and electron quasi-momentum relaxation time are obtained and analyzed. It is established that the fluctuations of the quasi-momentum relaxation time cannot be a “self-reliant” source of current 1/f-noise. A new and more general expression for Hooge’s coefficient is proposed. The newly proposed approach makes possible to investigate properties of spectral density of noises in a novel way incorporating potential mechanisms of fluctuations origin in semiconductors.
oai:arar.sci.am:23294
ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան
Dec 13, 2023
Feb 27, 2020
19
https://arar.sci.am/publication/26015
Edition name | Date |
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ELECTRON MOBILITY VARIANCE IN SEMICONDUCTORS: THE VARIANCE APPROACH | Dec 13, 2023 |
F. V. Gasparyan S. V. Melkonyan H. V. Asriyan C. E. Korman B. Noaman A. H. Arakelyan Shatvetyan, A. A. A. M. Avetisyan
S. V. Melkonyan A. L. Harutyunyan T. A. Zalinyan
M. Ivanyan A. Grigoryan S. V. Zakaryan A. Tsakanian
Kh. Sahakyan Kh. V. Nerkararyan
A. Zh. Khachatrian
N. Yeranyan S. G. Petrosyan A. Musayelyan L. Arutiunyan K. Avdjyan