Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
Department of Physics, Faculty of Science, Arak University, Arak, 38156-8-8349, Iran
Elastic constants of zinc oxide thin films have been determined using sin2? method. Surface morphology and crystalline structure of zinc oxide were examined, using atomic force microscope (AFM) and field emission scanning electron microscope (FESEM). The different planes and lattice parameters of ZnO films were obtained by High Temperature X-Ray Diffraction (HT-XRD) method. The minimum stress and residual stress were found to be 1.27±4.88 Mpa and4.62±0.23 Mpa for (101) and (110) different atomic planes.
oai:arar.sci.am:23373
ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան
Dec 13, 2023
Feb 27, 2020
8
https://arar.sci.am/publication/26115
Edition name | Date |
---|---|
X-Ray Elastic Constants of ZnO Thin Films | Dec 13, 2023 |
M. Ivanyan A. Grigoryan S. V. Zakaryan A. Tsakanian
Kh. Sahakyan Kh. V. Nerkararyan
A. Zh. Khachatrian
N. Yeranyan S. G. Petrosyan A. Musayelyan L. Arutiunyan K. Avdjyan
Lalayan, A. A.
A. Zh. Khachatrian V. A. Khoetsyan N. A. Aleksanyan D. R. Voskanyan
S. V. Melkonyan A. L. Harutyunyan T. A. Zalinyan