Object

Title: A PROOF OF PRINCIPLE STUDY OF A NOVEL SEMICONDUCTOR-BASED CHARGE PARTICLE IDENTIFICATION TELESCOPE

Publication Details:

Established in 2008

Journal or Publication Title:

Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես

Date of publication:

2012

Volume:

5

Number:

1

ISSN:

1829-1171

Official URL:


Coverage:

35-42

Abstract:

Charge particle telescopes are the primary equipment for charge particle identification spectroscopy applications in nuclear physics. It is proposed to fabricate the detector over a conventional silicon PIN diode detector in a vertical fashion using standard bipolar technology available with Bharat Electronics Ltd (BEL), Bangalore. As a part of this development, the first batch of proto-type Composite Charge Particle Identification Telescope (CCPIT) detectors have been successfully realized. This paper presents a comprehensive perspective on the design, fabrication and characterization of the first proto- types of silicon based CCPITs. Process and Device simulations in Technology Computer Aided Design (TCAD) were employed to extract analytical values for its performance parameters. Dynamic characterization through Alpha particle spectroscopy measurements has been performed to extract the energy resolution of the CCPIT detector.

Date created:

2012-04-17

Format:

pdf

Identifier:

oai:arar.sci.am:23316

Location of original object:

ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան

Object collections:

Last modified:

Dec 13, 2023

In our library since:

Feb 27, 2020

Number of object content hits:

20

All available object's versions:

https://arar.sci.am/publication/26045

Show description in RDF format:

RDF

Show description in OAI-PMH format:

OAI-PMH

This page uses 'cookies'. More information