A. O. Vardanyan ; S. R. Melikyan ; K. A. Movsesyan ; D. L. Oganesyan ; E. V. Chakhoyan
Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
National Institute of Metrology, Yerevan, Armenia
A new method of remote measurement of the roughness of a surface based on a non-linear optical profilometer is suggested and investigated. It is shown that for the spectral resolution of the spectrograph of 0.2 μm the linear resolution is 18 microns.
oai:arar.sci.am:23481
ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան
Apr 8, 2023
Feb 27, 2020
7
https://arar.sci.am/publication/26242
Edition name | Date |
---|---|
Laser Profilometer with Micron Spatial Resolution | Apr 8, 2023 |
Conference Chairs: Arsen Hakhoumian, (Dr.Sc., Ass. Member NAS RA, IRPhE, Armenia) Tigran Zakaryan (Dr. CEO IRPhE, Armenia)
L. Odabashyan Babajanyan, A. Zh. Baghdasaryan B. Friedman K. Lee
H. D. Khondkaryan