Object

Title: Laser Profilometer with Micron Spatial Resolution

Publication Details:

Established in 2008

Journal or Publication Title:

Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես

Date of publication:

2017

Volume:

10

Number:

3

ISSN:

1829-1171

Corporate Creators:

National Institute of Metrology, Yerevan, Armenia

Coverage:

99-103

Abstract:

A new method of remote measurement of the roughness of a surface based on a non-linear optical profilometer is suggested and investigated. It is shown that for the spectral resolution of the spectrograph of 0.2 μm the linear resolution is 18 microns.

Date created:

2017-10-06

Format:

pdf

Identifier:

oai:arar.sci.am:23481

Location of original object:

ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան

Object collections:

Last modified:

Apr 8, 2023

In our library since:

Feb 27, 2020

Number of object content hits:

7

All available object's versions:

https://arar.sci.am/publication/26242

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