Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
Department of Physics, Faculty of Science, Arak University, Arak, 38156-8-8349, Iran
Ag (Au)/SiO2 nanostructured thin films were fabricated on n-type silicon substrates by Radio Frequency (RF) magnetron sputtering technique. Crystalline, surface topography and optical properties of the prepared films were analyzed using X-ray diffractometry (XRD) technique, Atomic Force Microscopy (AFM) and UV–visible spectrophotometry, respectively. Optical absorption spectrum of the Ag/SiO2 thin films showed one surface plasmon resonance (SPR) absorption peak located at 310 nm relating to silver nanoparticles while the SPR peak in Au/SiO2 sample experienced a redshift around 450 nm.
oai:arar.sci.am:23363
ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան
Dec 13, 2023
Feb 27, 2020
33
https://arar.sci.am/publication/26101
Հրատարակության անուն | Ամսաթիվ |
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Characterization and Optical Absorption Properties of Plasmonic Nanostructured Thin Films | Dec 13, 2023 |
H. G. Julfayan A. H. Makaryan V. R. Tadevosyan