Publication Details:

Established in 2008

Journal or Publication Title:

Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես

Date of publication:

2013

Volume:

6

Number:

4

ISSN:

1829-1171

Official URL:

Corporate Creators:

Department of Physics, Faculty of Science, Arak University, Arak, 38156-8-8349, Iran

Coverage:

198-203

Abstract:

Ag (Au)/SiO2 nanostructured thin films were fabricated on n-type silicon substrates by Radio Frequency (RF) magnetron sputtering technique. Crystalline, surface topography and optical properties of the prepared films were analyzed using X-ray diffractometry (XRD) technique, Atomic Force Microscopy (AFM) and UV–visible spectrophotometry, respectively. Optical absorption spectrum of the Ag/SiO2 thin films showed one surface plasmon resonance (SPR) absorption peak located at 310 nm relating to silver nanoparticles while the SPR peak in Au/SiO2 sample experienced a redshift around 450 nm.

Date created:

2013-10-03

Format:

pdf

Identifier:

oai:arar.sci.am:23363

Location of original object:

ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան