Publication Details:

Established in 2008

Journal or Publication Title:

Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես

Date of publication:

2009

Volume:

2

Number:

4

ISSN:

1829-1171

Official URL:

Coverage:

295-301

Abstract:

The 5 to 150 nm thicknesses of Fe layers have been deposited by evaporation method onto Si substrates. Magnetic properties of samples are measured by using Magnetic Force Microscopy (MFM) and Alternating Gradient Force Magnetometry (AGFM). Structural and magnetic properties of samples have been reported from domains structure in MFM images as well as hysteresis loops in AGFM results. The domains width in Fe samples with 100 nm thickness were estimated about 2–4 μm. The XRD patterns are also show the formation of β-FeSi2 phase after annealing up to 700°C. The calculated effective anisotropy for samples with different thicknesses also shows oscillations with increasing Fe layer thickness.

Date created:

2009

Format:

pdf

Identifier:

oai:arar.sci.am:23251

Location of original object:

ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան