Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
To increase the resolution of X-ray diffraction methods, a new method is proposed in the work, which is theoretically proven and with which thin structures of diffraction images are experimentally observed. The X-ray interference pattern obtained by X-ray diffraction in a system consisting of a two-crystal system with a narrow gap and a thick absorbing crystal was studied. The theoretical period of the interbranch scattered bands obtained from this system is calculated. It is shown that the presence of a thick plate makes it possible to increase the period of the bands by about 5 to 10 times. For the first time, two dynamic effects were simultaneously observed: on one topogram, interbranch scattering bands and moire patterns formed in a two-crystal system were observed.
oai:arar.sci.am:263327
ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան
Dec 13, 2023
Nov 5, 2020
50
https://arar.sci.am/publication/286795
Հրատարակութեան անունը | Թուական |
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Drmeyan, H. R., X-Ray Diffraction Method for Investigation of Imperfections in Crystals Based on Interpretation of Sectional Topogram | Dec 13, 2023 |
V. V. Harutyunyan E. M. Aleksanyan V. C. Baghdasaryan P. B. Kostanyan G. Bondarenko M. Kirm S. Vielhauer
A. G. Ghazaryan
H. V. Baghdasaryan T. M. Knyazyan T. T. Hovhannisyan A. V. Daryan M. Marciniak
Grigoryan, B. A. V. V. Sahakyan Sargsyan, A. A. G. Zanyan T. S. Vardanyan V. M. Tsakanov
H. G. Julfayan
Bilen, S. G. A. H. Mkrtchyan L. Sh. Grigoryan H. F. Khachatryan M. Parrot A. V. Sargsyan A. R. Aramyan
A. S. Abrahamyan R. Yu. Chilingaryan