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Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
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Ստեղծողը:
Drmeyan, H. R. ; Margaryan, H. G.
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Ամփոփում:
To increase the resolution of X-ray diffraction methods, a new method is proposed in the work, which is theoretically proven and with which thin structures of diffraction images are experimentally observed. The X-ray interference pattern obtained by X-ray diffraction in a system consisting of a two-crystal system with a narrow gap and a thick absorbing crystal was studied. The theoretical period of the interbranch scattered bands obtained from this system is calculated. It is shown that the presence of a thick plate makes it possible to increase the period of the bands by about 5 to 10 times. For the first time, two dynamic effects were simultaneously observed: on one topogram, interbranch scattering bands and moire patterns formed in a two-crystal system were observed.