Publication Details:

Established in 2008

Journal or Publication Title:

Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես

Date of publication:

2020

Volume:

13

Number:

3

ISSN:

1829-1171

Official URL:

Coverage:

255-262

Abstract:

To increase the resolution of X-ray diffraction methods, a new method is proposed in the work, which is theoretically proven and with which thin structures of diffraction images are experimentally observed. The X-ray interference pattern obtained by X-ray diffraction in a system consisting of a two-crystal system with a narrow gap and a thick absorbing crystal was studied. The theoretical period of the interbranch scattered bands obtained from this system is calculated. It is shown that the presence of a thick plate makes it possible to increase the period of the bands by about 5 to 10 times. For the first time, two dynamic effects were simultaneously observed: on one topogram, interbranch scattering bands and moire patterns formed in a two-crystal system were observed.

Format:

pdf

Identifier:

oai:arar.sci.am:263327

Location of original object:

ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան