Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
Institute of Applied Problems of Physics of NAS RA ; Department of Department of Physics, Dezful Branch, Islamic Azad University, Dezful, IranPhysics, Dezful Branch, Islamic Azad University, Dezful, Iran
Integrated intensity of diffracted of X-ray beams was registered from single crystal of ammonium dihydrogen phosphate (ADP) in the Laue geometry under influence from different temperature gradient and was observed a minimum in integrated intensity dependence on the temperature gradient. Formula for integral intensity of reflection in crystals with weak deformation has been applied to reflecting planes and extracted values of χih and χrh (the imaginary and real parts of coefficient of Fourier expansion of polarizability). Similarly, this method was used for KDP crystal and the results are compared with theoretical values.
oai:arar.sci.am:23388
ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան
Dec 13, 2023
Feb 27, 2020
27
https://arar.sci.am/publication/26132
Trouni, K. G. V. Gh. Mirzoyan Mehdi Ghannad Dezfouli P. A. Grigoryan
Aditya M. Vora A. L. Gandhi
R. Yu. Chilingaryan
A. N. Gorban H. P. Sargsyan H. A. Wahab
V. S. Arakelyan R. N. Balasanyan S. G. Minasyan R. B. Kostanyan
M. Oettingen P. Stanisz
R. Avagyan R. Avetisyan A. Gyurjinyan V. Ivanyan I. Kerobyan