Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես
Institute of Applied Problems of Physics of NAS RA ; Shirak State University after M. Nalbandyan, Gyumri, Republic of Armenia
It is elaborated, made and tested a special interferometer–train metering device. А method for interferometric determination of X–Ray train length is offered. It is proved that the interference pattern disappears, when the path difference between imposing waves is more than the monochromatic X–Ray train length. The limit of disappearance of interference pattern depending on the value of path difference is determined. The X–Ray train length is determined which is close to the meaning determined theoretically.
կապին հետեւելուն համար սեղմէ հոս ; oai:arar.sci.am:322726
ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան
Dec 13, 2023
Jul 6, 2022
96
https://arar.sci.am/publication/350335
Հրատարակութեան անունը | Թուական |
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Drmeyan, H. R., Interferometric Method for Determination of X–ray Train Length | Dec 13, 2023 |
Sarian, V. K. Mkrtchyan, A. H. Meshcheryakov, R. V.
Drmeyan, H. R. Margaryan, H. G.
Hovhannisyan, M. A. Vardanyan, J. G. Mnatsakanyan, A. R. Mahtesyan, K. A. Mkhitaryan, S. A.
Mkhitaryan, S. A. Antonyan, A. P. Mnatsakanyan, A. R. Hovhannisyan, M. A. Chilingaryan, R. Y.
Taroyan, A. S. Kokanyan, E. P. Taroyan, Yu. A. Mkhitaryan, N. N.
Nalbandyan, V. V. Mkhitaryan, S. A. Badoyan, V. E. Babayan, I. A. Nalbandyan, A. H. Mkrtchyan, A. H.
Khachatryan, H. F. Mkhitaryan, S. A. Hovhannisyan, M. A. Vardanyan, J. G. Minasyan, A. M. Chilingaryan, R. Y.