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սեղմիր այստեղ կապին հետևելու համար
Title:
A novel approach for yield optimization
Other title:
Պիտանի արտադրանքի օպտիմալացման մի նոր մոտեցման մասին
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Abstract:
In this paper a novel approach for yield optimization is presented. While there are di®erent types of defects or other issues a®ecting the yield, only the "extra conductive material" type (potentially causing shorts circuits) is studied. The approach tends to improve the yield of the IC layout by reducing the area which is sensitive to random defects, the so-called critical area.