Publication Details:

Established in 2008

Journal or Publication Title:

Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես

Date of publication:

2015

Volume:

8

Number:

4

ISSN:

1829-1171

Official URL:

Corporate Creators:

National Research Tomsk Polytechnic University, 30, Lenina Avenue, Tomsk, 634050, Russia ; Institute of Applied Problems of Physics of NAS RA

Coverage:

166-169

Abstract:

We consider the hard X–ray diffraction from reflecting atomic planes (1011) of X–cut quartz single crystal with different thicknesses in Laue geometry influenced by the temperature gradient. It has been experimentally proved that, depending on the value of the temperature gradient, the intensity of the reflected beam can be increased by orders of magnitude. It is shown that by using the temperature gradient it is possible to separate a beam with high angular and spectral width from the white beam and move it to the direction of reflection.

Date created:

2015-12-06

Format:

pdf

Identifier:

oai:arar.sci.am:23416

Location of original object:

ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան