Object structure

Publication Details:

Established in 2008

Journal or Publication Title:

Armenian Journal of Physics=Ֆիզիկայի հայկական հանդես

Date of publication:

2014

Volume:

7

Number:

2

ISSN:

1829-1171

Official URL:


Title:

X-Ray Elastic Constants of ZnO Thin Films

Creator:

Najmeh Ayoqi ; Abdolali Zolanvari

Corporate Creators:

Department of Physics, Faculty of Science, Arak University, Arak, 38156-8-8349, Iran

Subject:

Physics ; Electronic structure and electrical properties of surfaces

Coverage:

87-92

Abstract:

Elastic constants of zinc oxide thin films have been determined using sin2? method. Surface morphology and crystalline structure of zinc oxide were examined, using atomic force microscope (AFM) and field emission scanning electron microscope (FESEM). The different planes and lattice parameters of ZnO films were obtained by High Temperature X-Ray Diffraction (HT-XRD) method. The minimum stress and residual stress were found to be 1.27±4.88 Mpa and4.62±0.23 Mpa for (101) and (110) different atomic planes.

Date created:

2014-05-26

Type:

Հոդված

Format:

pdf

Location of original object:

ՀՀ ԳԱԱ Հիմնարար գիտական գրադարան