@misc{Najmeh_Ayoqi_X-Ray,
 author={Najmeh Ayoqi and Abdolali Zolanvari},
 howpublished={online},
 abstract={Elastic constants of zinc oxide thin films have been determined using sin2? method. Surface morphology and crystalline structure of zinc oxide were examined, using atomic force microscope (AFM) and field emission scanning electron microscope (FESEM). The different planes and lattice parameters of ZnO films were obtained by High Temperature X-Ray Diffraction (HT-XRD) method. The minimum stress and residual stress were found to be 1.27±4.88 Mpa and4.62±0.23 Mpa for (101) and (110) different atomic planes.},
 type={Հոդված},
 title={X-Ray Elastic Constants of ZnO Thin Films},
 keywords={Physics, Electronic structure and electrical properties of surfaces},
}