@misc{K._Arshak_GENERATION-RECOMBINATION,
 author={K. Arshak and O. Korostynska},
 address={},
 howpublished={online},
 contents={},
 abstract={Deep understanding of physical properties of the materials under the influence of radiation is vital for the effective design of devices for radiation-sensing applications. Mixing oxides in various proportions was found to control the radiation sensing properties of the semiconductor films in terms of their sensitivity to γ-radiation exposure and working dose region.},
 title={GENERATION-RECOMBINATION PHENOMENA IN THIN METAL OXIDES FILMS UNDER THE INFLUENCE OF GAMMA RADIATION},
 type={Հոդված},
 keywords={Physics, Interfaces, Electronic structure and electrical properties of surfaces, Low-dimensional structures},
}